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1064nm, 400mW, 15ps Pulsed DFB Laser Diode

  • 1064nm, 400mW, DFB Laser Diode Image
  • 1064nm, 400mW, DFB Laser Diode Specifications
  • 1064nm, 400mW, DFB Laser Diode Pinout
  • 1064nm, 400mW, DFB Laser Diode Mechanical Drawing

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sku / item#: RLS/QLD106D-64D0
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Key Features
  • Single Longitudinal Mode Operation at 1064 nm
  • High Peak Output Power of 400 mW - Pulsed
  • 1-10 nsec Pulse Width Available
  • Fiber-Pigtailed 14-pin Butterfly Package With TEC
  • Integrated Optical Isolator with Polarization Maintaining Fiber
  • Other Wavelengths Available; Refer to Datasheet for Options

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  • CW Fiber Optical Output Power: 30 mW
  • CW Forward Current: 250 mA
  • Pulsed Peak Current (Pulse 10 ns/1MHz): 2 A
  • Pulsed Peak Optical Power (Pulse 10 ns/1MHz): 400 mW
  • Threshold Current: 15 mA
  • Pulse Width: 1 ns
  • Duty Cycle: 1%
  • Spectral Linewidth: 0.04 nm
  • Refer to Datasheet for Additional Specifications

Product Overview:

1064nm, 400mW, Pulsed DFB Laser Diode

The QLD1x6P-xxD0 is a high power 1µm-wavelength range distributed feedback (DFB) laser under 1-10 ns pulsed operation for use in seeder for fiber lasers and sensing applications. The laser is assembled into a 14-pin butterfly package with an optical isolator, a monitor PD and a thermo-electric cooler.

- Single longitudinal mode operation
- High peak output power of 400mW under pulsed operation
- 1-10 ns pulse width available
- Fiber-pigtailed 14-pin butterfly package with internal TEC
- Optical isolator integration
- Polarization maintaining fiber integration
- Available at other wavelengths; refer to datasheet for options

- Seeder for fiber lasers
- Sensing

Proper Handling and Operation of Diode Lasers

Diode lasers are highly susceptible to damage from ESD and from temperatures exceeding their specified safe operating range. The user is advised to use care and proper ESD safety practices when handling them to avoid damage to the laser. A properly rated low noise current source, a low thermal resistance mount and a temperature controller should be used for optimal device performance and reliability.

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